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Advanced Metrology

Advanced Metrology
  • Author : X. Jane Jiang
  • Publsiher : Academic Press
  • Release : 08 April 2020
  • ISBN : 0128218169
  • Pages : 374 pages
  • Rating : 4/5 from 21 ratings
GET THIS BOOKAdvanced Metrology

Summary:
Advanced Metrology: Freeform Surfaces provides the perfect guide for engineering designers and manufacturers interested in exploring the benefits of this technology. The inclusion of industrial case studies and examples will help readers to implement these techniques which are being developed across different industries as they offer improvements to the functional performance of products and reduce weight and cost. Includes case studies in every chapter to help readers implement the techniques discussed Provides unique advice from industry on hot subjects, including surface description and data processing Features links to online content, including video, code and software


Advanced Metrology

Advanced Metrology
  • Author : X. Jane Jiang,Paul J. Scott
  • Publisher : Academic Press
  • Release : 08 April 2020
GET THIS BOOKAdvanced Metrology

Advanced Metrology: Freeform Surfaces provides the perfect guide for engineering designers and manufacturers interested in exploring the benefits of this technology. The inclusion of industrial case studies and examples will help readers to implement these techniques which are being developed across different industries as they offer improvements to the functional performance of products and reduce weight and cost. Includes case studies in every chapter to help readers implement the techniques discussed Provides unique advice from industry on hot subjects, including


Advanced Mathematical And Computational Tools In Metrology And Testing Xi

Advanced Mathematical And Computational Tools In Metrology And Testing Xi
  • Author : Alistair B Forbes,Anna G Chunovkina,Sascha Eichstadt,Nien Fan Zhang,Franco Pavese
  • Publisher : World Scientific
  • Release : 16 October 2018
GET THIS BOOKAdvanced Mathematical And Computational Tools In Metrology And Testing Xi

This volume contains original, refereed contributions by researchers from institutions and laboratories across the world that are involved in metrology and testing. They were adapted from presentations made at the eleventh edition of the Advanced Mathematical and Computational Tools in Metrology and Testing conference held at the University of Strathclyde, Glasgow, in September 2017, organized by IMEKO Technical Committee 21, the National Physical Laboratory, UK, and the University of Strathclyde. The papers present new modeling approaches, algorithms and computational methods for analyzing


Optical Imaging and Metrology

Optical Imaging and Metrology
  • Author : Wolfgang Osten,Nadya Reingand
  • Publisher : John Wiley & Sons
  • Release : 10 September 2012
GET THIS BOOKOptical Imaging and Metrology

A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts,


Advanced Mathematical Tools in Metrology III

Advanced Mathematical Tools in Metrology III
  • Author : P Ciarlini,M G Cox,F Pavese,D Richter
  • Publisher : World Scientific
  • Release : 05 August 1997
GET THIS BOOKAdvanced Mathematical Tools in Metrology III

This book is of interest to researchers in universities, research centres and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and to whoever is working in the development of these mathematical tools. Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality as well in a better use of advanced mathematical tools and in the development of new ones. In this book scientists from both the mathematical and


Advanced Mathematical & Computational Tools in Metrology VII

Advanced Mathematical & Computational Tools in Metrology VII
  • Author : P. Ciarlini
  • Publisher : World Scientific
  • Release : 28 February 2021
GET THIS BOOKAdvanced Mathematical & Computational Tools in Metrology VII

This volume collects the refereed contributions based on the presentations made at the Seventh Workshop on Advanced Mathematical and Computational Tools in Metrology, a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources. The volume contains articles by world renowned metrologists and mathematicians involved in measurement science and, together with the six previous volumes in this series, constitutes an authoritative source of the mathematical, statistical and software tools necessary in


Advanced Mathematical and Computational Tools in Metrology and Testing VIII

Advanced Mathematical and Computational Tools in Metrology and Testing VIII
  • Author : Franco Pavese
  • Publisher : World Scientific
  • Release : 28 February 2021
GET THIS BOOKAdvanced Mathematical and Computational Tools in Metrology and Testing VIII

The main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engineers working in the relevant fields. This review volume consists of reviewed papers prepared on the basis of the oral and poster presentations of the Conference participants. It covers all the general matters of advanced statistical modeling (e.g. uncertainty evaluation, experimental design, optimization, data


Advanced Mathematical & Computational Tools in Metrology V

Advanced Mathematical & Computational Tools in Metrology V
  • Author : P. Ciarlini
  • Publisher : World Scientific
  • Release : 28 February 2021
GET THIS BOOKAdvanced Mathematical & Computational Tools in Metrology V

Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as on better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, will benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in


Advanced Mathematical and Computational Tools in Metrology VI

Advanced Mathematical and Computational Tools in Metrology VI
  • Author : P. Ciarlini
  • Publisher : World Scientific
  • Release : 28 February 2021
GET THIS BOOKAdvanced Mathematical and Computational Tools in Metrology VI

This volume collects refereed contributions based on the presentations made at the Sixth Workshop on Advanced Mathematical and Computational Tools in Metrology, held at the Istituto di Metrologia OC G. ColonnettiOCO (IMGC), Torino, Italy, in September 2003. It provides a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources, and promotes collaboration in the context of EU programmes, EUROMET and EA projects, and MRA requirements. It contains articles by an important,


Advanced Mathematical and Computational Tools in Metrology and Testing IX

Advanced Mathematical and Computational Tools in Metrology and Testing IX
  • Author : Franco Pavese
  • Publisher : World Scientific
  • Release : 28 February 2021
GET THIS BOOKAdvanced Mathematical and Computational Tools in Metrology and Testing IX

This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in G teborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in testing. The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also in keeping the challenge promoted by the Metre Convention, to



Automotive Engine Metrology

Automotive Engine Metrology
  • Author : Salah H. R. Ali
  • Publisher : CRC Press
  • Release : 06 July 2017
GET THIS BOOKAutomotive Engine Metrology

In recent decades, metrology—an accurate and precise technology of high quality for automotive engines—has garnered a great deal of scientific interest due to its unique advanced soft engineering techniques in design and diagnostics. Used in a variety of scientific applications, these techniques are now widely regarded as safer, more efficient, and more effective than traditional ones. This book compiles and details the cutting-edge research in science and engineering from the Egyptian Metrology Institute (National Institute for Standards) that



Advanced Nanoscale ULSI Interconnects: Fundamentals and Applications

Advanced Nanoscale ULSI Interconnects: Fundamentals and Applications
  • Author : Yosi Shacham-Diamand,Tetsuya Osaka,Madhav Datta,Takayuki Ohba
  • Publisher : Springer Science & Business Media
  • Release : 19 September 2009
GET THIS BOOKAdvanced Nanoscale ULSI Interconnects: Fundamentals and Applications

In Advanced ULSI interconnects – fundamentals and applications we bring a comprehensive description of copper-based interconnect technology for ultra-lar- scale integration (ULSI) technology for integrated circuit (IC) application. In- grated circuit technology is the base for all modern electronics systems. You can ?nd electronics systems today everywhere: from toys and home appliances to a- planes and space shuttles. Electronics systems form the hardware that together with software are the bases of the modern information society. The rapid growth and vast exploitation