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Architecture Design for Soft Errors

Architecture Design for Soft Errors
  • Author : Shubu Mukherjee
  • Publsiher : Morgan Kaufmann
  • Release : 29 August 2011
  • ISBN : 9780080558325
  • Pages : 360 pages
  • Rating : 4/5 from 21 ratings
GET THIS BOOKArchitecture Design for Soft Errors

Summary:
Architecture Design for Soft Errors provides a comprehensive description of the architectural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them. To provide readers with a better grasp of the broader problem definition and solution space, this book also delves into the physics of soft errors and reviews current circuit and software mitigation techniques. There are a number of different ways this book can be read or used in a course: as a complete course on architecture design for soft errors covering the entire book; a short course on architecture design for soft errors; and as a reference book on classical fault-tolerant machines. This book is recommended for practitioners in semi-conductor industry, researchers and developers in computer architecture, advanced graduate seminar courses on soft errors, and (iv) as a reference book for undergraduate courses in computer architecture. Helps readers build-in fault tolerance to the billions of microchips produced each year, all of which are subject to soft errors Shows readers how to quantify their soft error reliability Provides state-of-the-art techniques to protect against soft errors


Architecture Design for Soft Errors

Architecture Design for Soft Errors
  • Author : Shubu Mukherjee
  • Publisher : Morgan Kaufmann
  • Release : 29 August 2011
GET THIS BOOKArchitecture Design for Soft Errors

Architecture Design for Soft Errors provides a comprehensive description of the architectural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them. To provide readers with a better grasp of the broader problem definition and solution space, this book also delves into the physics of soft errors and reviews current circuit and software mitigation techniques. There are a number of different ways


Soft Errors

Soft Errors
  • Author : Jean-Luc Autran,Daniela Munteanu
  • Publisher : CRC Press
  • Release : 19 December 2017
GET THIS BOOKSoft Errors

Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment—one of the most


Soft Error Reliability of VLSI Circuits

Soft Error Reliability of VLSI Circuits
  • Author : Behnam Ghavami,Mohsen Raji
  • Publisher : Springer Nature
  • Release : 14 November 2020
GET THIS BOOKSoft Error Reliability of VLSI Circuits

This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today’s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits.


FPGAs and Parallel Architectures for Aerospace Applications

FPGAs and Parallel Architectures for Aerospace Applications
  • Author : Fernanda Kastensmidt,Paolo Rech
  • Publisher : Springer
  • Release : 07 December 2015
GET THIS BOOKFPGAs and Parallel Architectures for Aerospace Applications

This book introduces the concepts of soft errors in FPGAs, as well as the motivation for using commercial, off-the-shelf (COTS) FPGAs in mission-critical and remote applications, such as aerospace. The authors describe the effects of radiation in FPGAs, present a large set of soft-error mitigation techniques that can be applied in these circuits, as well as methods for qualifying these circuits under radiation. Coverage includes radiation effects in FPGAs, fault-tolerant techniques for FPGAs, use of COTS FPGAs in aerospace applications,


Soft Errors

Soft Errors
  • Author : Jean-Luc Autran,Daniela Munteanu
  • Publisher : CRC Press
  • Release : 25 February 2015
GET THIS BOOKSoft Errors

Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment—one of the most



Fault Tolerant Computer Architecture

Fault Tolerant Computer Architecture
  • Author : Daniel Sorin
  • Publisher : Morgan & Claypool Publishers
  • Release : 08 July 2009
GET THIS BOOKFault Tolerant Computer Architecture

For many years, most computer architects have pursued one primary goal: performance. Architects have translated the ever-increasing abundance of ever-faster transistors provided by Moore's law into remarkable increases in performance. Recently, however, the bounty provided by Moore's law has been accompanied by several challenges that have arisen as devices have become smaller, including a decrease in dependability due to physical faults. In this book, we focus on the dependability challenge and the fault tolerance solutions that architects are developing to


Soft Errors in Modern Electronic Systems

Soft Errors in Modern Electronic Systems
  • Author : Michael Nicolaidis
  • Publisher : Springer Science & Business Media
  • Release : 24 September 2010
GET THIS BOOKSoft Errors in Modern Electronic Systems

This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft


Resilient Architecture Design for Voltage Variation

Resilient Architecture Design for Voltage Variation
  • Author : Vijay Janapa Reddi,Meeta Sharma Gupta
  • Publisher : Morgan & Claypool Publishers
  • Release : 01 May 2013
GET THIS BOOKResilient Architecture Design for Voltage Variation

Shrinking feature size and diminishing supply voltage are making circuits sensitive to supply voltage fluctuations within the microprocessor, caused by normal workload activity changes. If left unattended, voltage fluctuations can lead to timing violations or even transistor lifetime issues that degrade processor robustness. Mechanisms that learn to tolerate, avoid, and eliminate voltage fluctuations based on program and microarchitectural events can help steer the processor clear of danger, thus enabling tighter voltage margins that improve performance or lower power consumption. We


Dependability in Electronic Systems

Dependability in Electronic Systems
  • Author : Nobuyasu Kanekawa,Eishi H. Ibe,Takashi Suga,Yutaka Uematsu
  • Publisher : Springer Science & Business Media
  • Release : 08 November 2010
GET THIS BOOKDependability in Electronic Systems

This book covers the practical application of dependable electronic systems in real industry, such as space, train control and automotive control systems, and network servers/routers. The impact from intermittent errors caused by environmental radiation (neutrons and alpha particles) and EMI (Electro-Magnetic Interference) are introduced together with their most advanced countermeasures. Power Integration is included as one of the most important bases of dependability in electronic systems. Fundamental technical background is provided, along with practical design examples. Readers will obtain


Computer Organization and Design

Computer Organization and Design
  • Author : David A. Patterson,John L. Hennessy
  • Publisher : Elsevier
  • Release : 07 August 2004
GET THIS BOOKComputer Organization and Design

This best selling text on computer organization has been thoroughly updated to reflect the newest technologies. Examples highlight the latest processor designs, benchmarking standards, languages and tools. As with previous editions, a MIPs processor is the core used to present the fundamentals of hardware technologies at work in a computer system. The book presents an entire MIPS instruction set—instruction by instruction—the fundamentals of assembly language, computer arithmetic, pipelining, memory hierarchies and I/O. A new aspect of the


VLSI-SoC: Research Trends in VLSI and Systems on Chip

VLSI-SoC: Research Trends in VLSI and Systems on Chip
  • Author : Giovanni De Micheli,Salvador Mir,Ricardo Reis
  • Publisher : Springer
  • Release : 23 August 2010
GET THIS BOOKVLSI-SoC: Research Trends in VLSI and Systems on Chip

This book contains extended and revised versions of the best papers presented during the fourteenth IFIP TC 10/WG 10.5 International Conference on Very Large Scale Integration. This conference provides a forum to exchange ideas and show industrial and academic research results in microelectronics design. The current trend toward increasing chip integration and technology process advancements brings about stimulating new challenges both at the physical and system-design levels.


The Architecture of Error

The Architecture of Error
  • Author : Francesca Hughes
  • Publisher : MIT Press
  • Release : 07 November 2014
GET THIS BOOKThe Architecture of Error

When architects draw even brick walls to six decimal places with software designed to cut lenses, it is clear that the logic that once organized relations between precision and material error in construction has unraveled. Precision, already a promiscuous term, seems now to have been uncoupled from its contract with truthfulness. Meanwhile error, and the always-political space of its dissent, has reconfigured itself. In The Architecture of Error Francesca Hughes argues that behind the architect's acute fetishization of redundant precision



Design of Soft Error Robust High Speed 64-bit Logarithmic Adder

Design of Soft Error Robust High Speed 64-bit Logarithmic Adder
  • Author : Jaspal Singh Shah
  • Publisher : Anonim
  • Release : 08 March 2021
GET THIS BOOKDesign of Soft Error Robust High Speed 64-bit Logarithmic Adder

Continuous scaling of the transistor size and reduction of the operating voltage have led to a significant performance improvement of integrated circuits. However, the vulnerability of the scaled circuits to transient data upsets or soft errors, which are caused by alpha particles and cosmic neutrons, has emerged as a major reliability concern. In this thesis, we have investigated the effects of soft errors in combinational circuits and proposed soft error detection techniques for high speed adders. In particular, we have