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Atom Probe Tomography

Atom Probe Tomography
  • Author : Michael K. Miller
  • Publsiher : Springer
  • Release : 31 July 2014
  • ISBN : 148997430X
  • Pages : 423 pages
  • Rating : 4/5 from 21 ratings
GET THIS BOOKAtom Probe Tomography

Summary:
Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography. Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. A full description of the local electrode atom probe – a new state-of-the-art instrument – is also provided, along with detailed descriptions and limitations of laser pulsing as a method to field evaporate atoms. Valuable coverage of the new ionization theory is also included, which underpins the overall technique.


Atom-Probe Tomography

Atom-Probe Tomography
  • Author : Michael K. Miller,Richard G. Forbes
  • Publisher : Springer
  • Release : 31 July 2014
GET THIS BOOKAtom-Probe Tomography

Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography. Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. A full description of the local electrode atom probe – a new

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Atom Probe Tomography

Atom Probe Tomography
  • Author : Williams Lefebvre,Francois Vurpillot,Xavier Sauvage
  • Publisher : Academic Press
  • Release : 30 May 2016
GET THIS BOOKAtom Probe Tomography

Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining

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Atom Probe Tomography

Atom Probe Tomography
  • Author : Michael K. Miller
  • Publisher : Springer Science & Business Media
  • Release : 06 December 2012
GET THIS BOOKAtom Probe Tomography

The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize

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Atom-Probe Tomography

Atom-Probe Tomography
  • Author : Michael K. Miller,Richard G. Forbes
  • Publisher : Springer
  • Release : 02 August 2014
GET THIS BOOKAtom-Probe Tomography

Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography. Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. A full description of the local electrode atom probe – a new

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Atom Probe Microscopy

Atom Probe Microscopy
  • Author : Baptiste Gault,Michael P. Moody,Julie M. Cairney,Simon P. Ringer
  • Publisher : Springer Science & Business Media
  • Release : 27 August 2012
GET THIS BOOKAtom Probe Microscopy

Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption

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Local Electrode Atom Probe Tomography

Local Electrode Atom Probe Tomography
  • Author : David J. Larson,Ty J. Prosa,Robert M. Ulfig,Brian P. Geiser,Thomas F. Kelly
  • Publisher : Springer Science & Business Media
  • Release : 12 December 2013
GET THIS BOOKLocal Electrode Atom Probe Tomography

This book is the first, single-source guide to successful experiments using the local electrode atom probe (LEAP®) microscope. Coverage is both comprehensive and user friendly, including the fundamentals of preparing specimens for the microscope from a variety of materials, the details of the instrumentation used in data collection, the parameters under which optimal data are collected, the current methods of data reconstruction, and selected methods of data analysis. Tricks of the trade are described that are often learned only through

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Local Electrode Atom Probe Tomography

Local Electrode Atom Probe Tomography
  • Author : David J. Larson,Ty J Prosa,Robert M. Ulfig,Brian P. Geiser,Thomas F. Kelly
  • Publisher : Springer
  • Release : 07 December 2013
GET THIS BOOKLocal Electrode Atom Probe Tomography

This book is the first, single-source guide to successful experiments using the local electrode atom probe (LEAP®) microscope. Coverage is both comprehensive and user friendly, including the fundamentals of preparing specimens for the microscope from a variety of materials, the details of the instrumentation used in data collection, the parameters under which optimal data are collected, the current methods of data reconstruction, and selected methods of data analysis. Tricks of the trade are described that are often learned only through

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Atom Probe Tomography of Hard Nitride and Boride Thin Films

Atom Probe Tomography of Hard Nitride and Boride Thin Films
  • Author : David L. J. Engberg
  • Publisher : Linköping University Electronic Press
  • Release : 02 August 2019
GET THIS BOOKAtom Probe Tomography of Hard Nitride and Boride Thin Films

Hard ceramic thin films, including TiSiN, ZrAlN, ZrB2, and ZrTaB2, with applications for wear-resistant coatings, have been studied using atom probe tomography and correlated with several other analytical techniques, including X-ray diffraction, electron microscopy, and elastic recoil detection analysis. Outstanding obstacles for quantitative atom probe tomography of ceramic thin films have been surmounted. Mass spectral overlaps in TiSiN, which make 28Si indistinguishable from 14N, was resolved by isotopic substitution with 15N, and the nanostructural distribution of elements was thus revealed

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Microstructural Geochronology

Microstructural Geochronology
  • Author : Desmond E. Moser,Fernando Corfu,James R. Darling,Steven M. Reddy,Kimberly Tait
  • Publisher : John Wiley & Sons
  • Release : 23 November 2017
GET THIS BOOKMicrostructural Geochronology

Microstructural Geochronology Geochronology techniques enable the study of geological evolution and environmental change over time. This volume integrates two aspects of geochronology: one based on classical methods of orientation and spatial patterns, and the other on ratios of radioactive isotopes and their decay products. The chapters illustrate how material science techniques are taking this field to the atomic scale, enabling us to image the chemical and structural record of mineral lattice growth and deformation, and sometimes the patterns of radioactive

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Wide Bandgap Semiconductor Electronics And Devices

Wide Bandgap Semiconductor Electronics And Devices
  • Author : Singisetti Uttam,Razzak Towhidur,Zhang Yuewei
  • Publisher : World Scientific
  • Release : 10 December 2019
GET THIS BOOKWide Bandgap Semiconductor Electronics And Devices

With the dawn of Gallium Oxide (Ga2O₃) and Aluminum Gallium Nitride (AlGaN) electronics and the commercialization of Gallium Nitride (GaN) and Silicon Carbide (SiC) based devices, the field of wide bandgap materials and electronics has never been more vibrant and exciting than it is now. Wide bandgap semiconductors have had a strong presence in the research and development arena for many years. Recently, the increasing demand for high efficiency power electronics and high speed communication electronics, together with the

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