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New Approaches to Image Processing based Failure Analysis of Nano Scale ULSI Devices

New Approaches to Image Processing based Failure Analysis of Nano Scale ULSI Devices
  • Author : Zeev Zalevsky
  • Publsiher : William Andrew
  • Release : 13 November 2013
  • ISBN : 0128000171
  • Pages : 110 pages
  • Rating : 4/5 from 21 ratings
GET THIS BOOKNew Approaches to Image Processing based Failure Analysis of Nano Scale ULSI Devices

Summary:
New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. Engineers and scientists face the pressing problem in ULSI development and quality assurance: microscopy methods can’t keep pace with the continuous shrinking of feature size in microelectronics. Nanometer scale sizes are below the resolution of light, and imaging these features is nearly impossible even with electron microscopes, due to image noise. This book presents novel "smart" image processing methods, applications, and case studies concerning quality improvement of microscope images of microelectronic chips and process optimization. It explains an approach for high-resolution imaging of advanced metallization for micro- and nanoelectronics. This approach obviates the time-consuming preparation and selection of microscope measurement and sample conditions, enabling not only better electron-microscopic resolution, but also more efficient testing and quality control. This in turn leads to productivity gains in design and development of nano-scale ULSI chips. The authors also present several approaches for super-resolving low-resolution images to improve failure analysis of microelectronic chips. Acquaints users with new software-based approaches to enhance high-resolution microscope imaging of microchip structures Demonstrates how these methods lead to productivity gains in the development of ULSI chips Presents several techniques for the superresolution of images, enabling engineers and scientists to improve their results in failure analysis of microelectronic chips


New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices

New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices
  • Author : Zeev Zalevsky,Pavel Livshits,Eran Gur
  • Publisher : William Andrew
  • Release : 13 November 2013
GET THIS BOOKNew Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices

New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. Engineers and scientists face the pressing problem in ULSI development and quality assurance: microscopy methods can’t keep pace with the continuous shrinking of feature size in microelectronics. Nanometer scale sizes are below the resolution of light, and imaging these features is nearly impossible even with electron microscopes, due to image noise. This

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Handbook of Silicon Based MEMS Materials and Technologies

Handbook of Silicon Based MEMS Materials and Technologies
  • Author : Markku Tilli,Mervi Paulasto-Krockel,Teruaki Motooka,Veikko Lindroos
  • Publisher : William Andrew
  • Release : 02 September 2015
GET THIS BOOKHandbook of Silicon Based MEMS Materials and Technologies

The Handbook of Silicon Based MEMS Materials and Technologies, Second Edition, is a comprehensive guide to MEMS materials, technologies, and manufacturing that examines the state-of-the-art with a particular emphasis on silicon as the most important starting material used in MEMS. The book explains the fundamentals, properties (mechanical, electrostatic, optical, etc.), materials selection, preparation, manufacturing, processing, system integration, measurement, and materials characterization techniques, sensors, and multi-scale modeling methods of MEMS structures, silicon crystals, and wafers, also covering micromachining technologies in MEMS

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Failure Analysis

Failure Analysis
  • Author : Marius Bazu,Titu Bajenescu
  • Publisher : John Wiley & Sons
  • Release : 08 March 2011
GET THIS BOOKFailure Analysis

Failure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. The physics-of-failure approach is the only internationally accepted solution for continuously improving the reliability of materials, devices and processes. The models have been developed from the physical and chemical phenomena that are responsible for degradation or failure of electronic components and materials and now replace popular distribution models for failure mechanisms such as Weibull or lognormal. Reliability engineers

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C, H, N and O in Si and Characterization and Simulation of Materials and Processes

C, H, N and O in Si and Characterization and Simulation of Materials and Processes
  • Author : A. Borghesi,U.M. Gösele,J. Vanhellemont,A.M. Gué,M. Djafari-Rouhani
  • Publisher : Newnes
  • Release : 02 December 2012
GET THIS BOOKC, H, N and O in Si and Characterization and Simulation of Materials and Processes

Containing over 200 papers, this volume contains the proceedings of two symposia in the E-MRS series. Part I presents a state of the art review of the topic - Carbon, Hydrogen, Nitrogen and Oxygen in Silicon and in Other Elemental Semiconductors. There was strong representation from the industrial laboratories, illustrating that the topic is highly relevant for the semiconductor industry. The second part of the volume deals with a topic which is undergoing a process of convergence with two concerns that

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ICT - Energy Concepts for Energy Efficiency and Sustainability

ICT - Energy Concepts for Energy Efficiency and Sustainability
  • Author : Giorgos Fagas,Luca Gammaitoni,John P. Gallagher,Douglas Paul
  • Publisher : BoD – Books on Demand
  • Release : 22 March 2017
GET THIS BOOKICT - Energy Concepts for Energy Efficiency and Sustainability

In a previous volume (ICT-Energy-Concepts Towards Zero-Power ICT; referenced below as Vol. 1), we addressed some of the fundamentals related to bridging the gap between the amount of energy required to operate portable/mobile ICT systems and the amount of energy available from ambient sources. The only viable solution appears to be to attack the gap from both sides, i.e. to reduce the amount of energy dissipated during computation and to improve the efficiency in energy-harvesting technologies. In this book,

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Nanotechnology and Nanoelectronics

Nanotechnology and Nanoelectronics
  • Author : Wolfgang Fahrner
  • Publisher : Springer Science & Business Media
  • Release : 05 December 2005
GET THIS BOOKNanotechnology and Nanoelectronics

Split a human hair thirty thousand times, and you have the equivalent of a nanometer. The aim of this work is to provide an introduction into nanotechnology for the s- entifically interested. However, such an enterprise requires a balance between comprehensibility and scientific accuracy. In case of doubt, preference is given to the latter. Much more than in microtechnology – whose fundamentals we assume to be known – a certain range of engineering and natural sciences are interwoven in nanotechnology. For instance,

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Nanotechnology Research Directions: IWGN Workshop Report

Nanotechnology Research Directions: IWGN Workshop Report
  • Author : R.S. Williams,P. Alivisatos
  • Publisher : Springer Science & Business Media
  • Release : 09 March 2013
GET THIS BOOKNanotechnology Research Directions: IWGN Workshop Report

energy production, environmental management, transportation, communication, computation, and education. As the twenty-first century unfolds, nanotechnology's impact on the health, wealth, and security of the world's people is expected to be at least as significant as the combined influences in this century of antibiotics, the integrated circuit, and human-made polymers. Dr. Neal Lane, Advisor to the President for Science and Technology and former National Science Foundation (NSF) director, stated at a Congressional hearing in April 1998, "If I were asked for an

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Nano-CMOS Circuit and Physical Design

Nano-CMOS Circuit and Physical Design
  • Author : Ban Wong,Anurag Mittal,Yu Cao,Greg W. Starr
  • Publisher : John Wiley & Sons
  • Release : 08 April 2005
GET THIS BOOKNano-CMOS Circuit and Physical Design

Based on the authors' expansive collection of notes taken over the years, Nano-CMOS Circuit and Physical Design bridges the gap between physical and circuit design and fabrication processing, manufacturability, and yield. This innovative book covers: process technology, including sub-wavelength optical lithography; impact of process scaling on circuit and physical implementation and low power with leaky transistors; and DFM, yield, and the impact of physical implementation.

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Integrated Circuit Test Engineering

Integrated Circuit Test Engineering
  • Author : Ian A. Grout
  • Publisher : Springer Science & Business Media
  • Release : 22 August 2005
GET THIS BOOKIntegrated Circuit Test Engineering

Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively

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