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Reliability and Failure of Electronic Materials and Devices

Reliability and Failure of Electronic Materials and Devices
  • Author : Milton Ohring
  • Publsiher : Academic Press
  • Release : 03 November 2014
  • ISBN : 0080575528
  • Pages : 758 pages
  • Rating : 4/5 from 21 ratings
GET THIS BOOKReliability and Failure of Electronic Materials and Devices

Summary:
Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites


Reliability and Failure of Electronic Materials and Devices

Reliability and Failure of Electronic Materials and Devices
  • Author : Milton Ohring,Lucian Kasprzak
  • Publisher : Academic Press
  • Release : 03 November 2014
GET THIS BOOKReliability and Failure of Electronic Materials and Devices

Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation

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Practical Reliability Of Electronic Equipment And Products

Practical Reliability Of Electronic Equipment And Products
  • Author : Eugene R. Hnatek
  • Publisher : CRC Press
  • Release : 25 October 2002
GET THIS BOOKPractical Reliability Of Electronic Equipment And Products

Practical Reliability of Electronic Equipment and Products will help electrical, electronics, manufacturing, mechanical, systems design, and reliability engineers; electronics production managers; electronic circuit designers; and upper-level undergraduate and graduate students in these disciplines.

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Reliability of Electronic Components

Reliability of Electronic Components
  • Author : Titu I. Bajenescu,Marius I. Bazu
  • Publisher : Springer Science & Business Media
  • Release : 06 December 2012
GET THIS BOOKReliability of Electronic Components

This application-oriented professional book explains why components fail, addressing the needs of engineers who apply reliability principles in design, manufacture, testing and field service. A detailed index, a glossary, acronym lists, reliability dictionaries and a rich specific bibliography complete the book.

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Engineering Materials Science

Engineering Materials Science
  • Author : Milton Ohring
  • Publisher : Academic Press
  • Release : 23 May 1995
GET THIS BOOKEngineering Materials Science

Milton Ohring's Engineering Materials Science integrates the scientific nature and modern applications of all classes of engineering materials. This comprehensive, introductory textbook will provide undergraduate engineering students with the fundamental background needed to understand the science of structure–property relationships, as well as address the engineering concerns of materials selection in design, processing materials into useful products, andhow material degrade and fail in service. Specific topics include: physical and electronic structure; thermodynamics and kinetics; processing; mechanical, electrical, magnetic, and optical

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Failure Analysis

Failure Analysis
  • Author : Marius Bazu,Titu Bajenescu
  • Publisher : John Wiley & Sons
  • Release : 08 March 2011
GET THIS BOOKFailure Analysis

Failure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. The physics-of-failure approach is the only internationally accepted solution for continuously improving the reliability of materials, devices and processes. The models have been developed from the physical and chemical phenomena that are responsible for degradation or failure of electronic components and materials and now replace popular distribution models for failure mechanisms such as Weibull or lognormal. Reliability engineers

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Semiconductor Material and Device Characterization

Semiconductor Material and Device Characterization
  • Author : Dieter K. Schroder
  • Publisher : John Wiley & Sons
  • Release : 10 February 2006
GET THIS BOOKSemiconductor Material and Device Characterization

This Third Edition updates a landmark text with thelatest findings The Third Edition of the internationally laudedSemiconductor Material and Device Characterization bringsthe text fully up-to-date with the latest developments in the fieldand includes new pedagogical tools to assist readers. Not only doesthe Third Edition set forth all the latest measurementtechniques, but it also examines new interpretations and newapplications of existing techniques. Semiconductor Material and Device Characterizationremains the sole text dedicated to characterization techniques formeasuring semiconductor materials and devices. Coverage includesthe

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Reliability of Semiconductor Lasers and Optoelectronic Devices

Reliability of Semiconductor Lasers and Optoelectronic Devices
  • Author : Robert Herrick,Osamu Ueda
  • Publisher : Woodhead Publishing
  • Release : 06 March 2021
GET THIS BOOKReliability of Semiconductor Lasers and Optoelectronic Devices

Reliability of Semiconductor Lasers and Optoelectronic Devices simplifies complex concepts of optoelectronics reliability with approachable introductory chapters and a focus on real-world applications. This book provides a brief look at the fundamentals of laser diodes, introduces reliability qualification, and then presents real-world case studies discussing the principles of reliability and what occurs when these rules are broken. Then this book comprehensively looks at optoelectronics devices and the defects that cause premature failure in them and how to control those defects.

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Proceedings of the International Workshop on Physics and Technology of Thin Films

Proceedings of the International Workshop on Physics and Technology of Thin Films
  • Author : Alireza Zaker Moshfegh
  • Publisher : World Scientific
  • Release : 23 May 2022
GET THIS BOOKProceedings of the International Workshop on Physics and Technology of Thin Films

Thin films science and technology plays an important role in the high-tech industries. Thin film technology has been developed primarily for the need of the integrated circuit industry. The demand for development of smaller and smaller devices with higher speed especially in new generation of integrated circuits requires advanced materials and new processing techniques suitable for future giga scale integration (GSI) technology. In this regard, physics and technology of thin films can play an important role to acheive this goal.

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Electronics Reliability–Calculation and Design

Electronics Reliability–Calculation and Design
  • Author : Geoffrey W. A. Dummer,Norman B. Griffin
  • Publisher : Elsevier
  • Release : 22 October 2013
GET THIS BOOKElectronics Reliability–Calculation and Design

Electronics Reliability–Calculation and Design provides an introduction to the fundamental concepts of reliability. The increasing complexity of electronic equipment has made problems in designing and manufacturing a reliable product more and more difficult. Specific techniques have been developed that enable designers to integrate reliability into their products, and reliability has become a science in its own right. The book begins with a discussion of basic mathematical and statistical concepts, including arithmetic mean, frequency distribution, median and mode, scatter or

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Influence of Temperature on Microelectronics and System Reliability

Influence of Temperature on Microelectronics and System Reliability
  • Author : Pradeep Lall,Michael Pecht,Edward B. Hakim
  • Publisher : CRC Press
  • Release : 24 April 1997
GET THIS BOOKInfluence of Temperature on Microelectronics and System Reliability

This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures. The author provides readers a sound scientific basis for system operation at realistic steady state temperatures without reliability penalties. Higher temperature performance than is commonly recommended is shown to be cost effective in production for life cycle costs. The microelectronic package considered in the book is assumed to

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Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
  • Author : Osamu Ueda,Stephen J. Pearton
  • Publisher : Springer Science & Business Media
  • Release : 22 September 2012
GET THIS BOOKMaterials and Reliability Handbook for Semiconductor Optical and Electron Devices

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices.

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Optical Waveguide Sensing and Imaging

Optical Waveguide Sensing and Imaging
  • Author : Wojtek J. Bock,Israel Gannot,Stoyan Tanev
  • Publisher : Springer Science & Business Media
  • Release : 14 December 2007
GET THIS BOOKOptical Waveguide Sensing and Imaging

The book explores various aspects of existing and emerging fiber and waveguide optics sensing and imaging technologies including recent advances in nanobiophotonics. The focus is both on fundamental and applied research as well as on applications in civil engineering, biomedical sciences, environment, security and defence. The book aims to provide a reference of state-of-the-art overviews covering a variety of topics on the interface of engineering and biomedical sciences.

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